Monday, 18. May 2020 until Sunday, 24. May 2020.

  • 2020-05-22T10:00:00+02:00
  • 2020-05-22T15:00:00+02:00
  • https://meet.google.com/agf-sqho-ixt
May

22

Friday

May 22, 2020 from 10:00 AM to 03:00 PM

Títol de la tesi: Reliability-aware circuit design to mitigate impact of device defects and variability in emerging memristor-based applications Unitat Estructural: Enginyeria Electrònica Directors: JOSE ANTONIO RUBIO SOLA Codirector: IOANNIS VOURKAS