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Events in May 2020

  • 2020-05-22T10:00:00+02:00
  • 2020-05-22T15:00:00+02:00
Fr 22. May.

May 22, 2020 from 10:00 AM to 03:00 PM

Títol de la tesi: Reliability-aware circuit design to mitigate impact of device defects and variability in emerging memristor-based applications Unitat Estructural: Enginyeria Electrònica Directors: JOSE ANTONIO RUBIO SOLA Codirector: IOANNIS VOURKAS